How to Make the Citation of this Document using the INPE Standard (BibINPE Format)
CHIARAMONTE, T.; ABRAMOF, E.; FABREGUETTE, F.; SACILOTTI; CARDOSO, L. P. X-ray multiple diffraction in the characterization of TiNO and TiO2 thin films grown on Si(0 0 1). Applied Surface Science, v. 253, n. 3, p. 1590-1594, Nov. 2006. (INPE-14414-PRE/9498). Available from: <http://urlib.net/ibi/6qtX3pFwXQZGivnK2Y/NnMP3>.
How to Make the In-Text Citation (by author/year)
... as proposed by Chiaramonte et al. (2006).
... may be found in the literature (CHIARAMONTE et al., 2006).